Electron Microscopes
Electron Microscopy Sciences Conductive Aluminum/Nickel Tape
Electrically conductive and with a clean background, the tape is ideal for scanning electron microscopy (SEM). Pressed thin Al. Adhesive power/25mm width: 840 gf. Capacity after 60 min: 0.1mm.
Conductive resistivity: 0.008ohm/sq. Inch
Thickness: 0.09 mm
Pad: 0.035 mm
Adhesive: 0.040mm
Electron Microscopy Sciences Black Bakelite Thermosetting Hot Mount Resin 1 KG
Black bakelite with carbon filler, thermosetting. SEM examination.
Electron Microscopy Sciences Shorter Pin SEM Stub Slotted 1/2" Head with Shorter Pin (6 mm), Aluminum, 1/8" Pin diameter
Cambridge, Phillips, Camscan, B&L, Etec, Zeiss SEM specimen mounts. Tapered end pin, slotted head.
Head: 1/2"
Pin height: 6 mm
Pin diameter: 1/8"
Electron Microscopy Sciences EMS Molybdenum Aperture with 15 µm hole, 2 mm O.D., 0.53 mm thick
Molybdenum disc aperture with 15 um hole for use with Cambridge, Siemens, JEOL, and Cameca electron microscopes.
O.D.: 2 mm
Thickness: 0.53 mm
Electron Microscopy Sciences AFM Substrate Type P Silicon Wafer 2", 50 mm diameter, <100> Orientation
These silicon wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer. The wafers are polished on one side.
Diameter: 50 mm
Orientation: <100>
Thickness: 230-330 µm
Roughness: 2nm
Resistance: 1-30 ohms
Electron Microscopy Sciences Gilder Standard Square 250 mesh Gold Grid
A reliable support specimen grid source. Features well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected. 3.05 mm diameter, 0.7 mil (18 um) thickness.
Grid: Gold
Pitch: 100 µm
Hole: 70 µm
Bar: 30 µm
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Electron Microscopy Sciences Gilder Aperture Grid with Single 1000 µm hole, Gold
Single Slot aperture grids have a thickness of are 50 microns. Aperture diameter is 1000um.
Material: Gold
Electron Microscopy Sciences Gilder Hexagonal 75 mesh Nickel Grid
A reliable support specimen grid source. Features: well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected. The copper grids with palladium plating offers better grid strength and avoids tarnishing. 3.05 mm diameter, 0.7 mil (18um) thickness.
Grid: Nickel
Pitch: 340 µm
Hole: 290 µm
Bar: 50 µm
Electron Microscopy Sciences Gilder Parallel Bar Grid G50P, Copper
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Copper
Pitch: 500 µm
Hole: 416 µm
Bar: 84 µm
Electron Microscopy Sciences Gilder Parallel Bar Grid G75P, Gold
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Gold
Pitch: 340 µm
Hole: 270 µm
Bar: 70 µm
Electron Microscopy Sciences Gilder Parallel Bar Grid G50PB, Copper
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Copper
Pitch: 500 µm
Hole: 416 µm
Bar: 84 µm
Electron Microscopy Sciences Shorter Pin SEM Stub Slotted 1/2" Head with Shorter Pin (6 mm), Aluminum, 1/8" Pin diameter
Cambridge, Phillips, Camscan, B&L, Etec, Zeiss SEM specimen mounts. Tapered end pin, slotted head.
Head: 1/2"
Pin height: 6 mm
Pin diameter: 1/8"
Electron Microscopy Sciences Multi Pin Holder 45 degree for 3 pin stubs
This 25.4 mm in diameter 45 Degree multi pin holder is designed to save time. It allows for a higher SE signal without having to tilt the specimen It is made from machined aluminum with stainless steel Allen set screws. It accommodates up to three standard 12.7 mm (1/2") pin stubs with 3.2 mm (1/8") pin.